Photoelectron Emission Microscopy is an imaging technique that utilizes secondary electron emitted from surface upon x-ray irradiation to form a frame of image. High resolution surface and sub-surface image with elemental, chemical and magnetic contrast can be acquired.
		Schematic drawing of PEEM Station Omicron FOCUS-IS PEEM Optics
	Major instrumentation
	Omicron FOCUS-IS PEEM
	Experimental technique
	Microscopy, μ-XAS
	Capabilities
	Energy Rang: 60 ~ 1400eV Polarization: Linear, left/right circular, elliptical polarized Spatial Resolution (UV/SR source): Better than 0.15/0.2μm Sample Requirement: Solid, UHV compatible, 5~10mm in diameter
	Useful Information
	Principle of PEEM
	Sample holder used for PEEM station
	PEEM Station at EPU AUV image of NiFe ring with 0.5µm Line Width